Electron microscopy - CimeX

Microscopy Center of the Ecole polytechnique.

Main technical features

  • FEI Titan ETEM Cs corrected image 60-300kV (dedicated to molecular beam epitaxie (MBE) and Chemical vapor Deposition (CVD))
  • FEI Titan Themis 80-300 kV (dedicated to liquid phase and cryo-microscopy)
  • JEOL 2010F 200 kV
  • HITACHI S4800 FESEM
  • FEI Titan Themis  Cs corrected probe 80-200kV (equipment shared with C2N and LPS available at 30% of the time)
  • Cryo-transfer holder (Gatan et Fishone)
  • Heating and electrical sample holder (Protochips Aduro)
  • Sample holder for liquid and electrochemistry (Protochips Poseidon)

Sample preparation

  • FEI Scios FIB dual beam (equipment shared with C2N and LPS available at 30% of the time)Ultra-cryomicrotome Leica UC7
  • Eletrochemical polishing
  • Mechanical polishing (Tripode)
  • Plasma cleaner
  • Ultrasonic cutter
  • Dimple grinder

Access conditions

  • Collaborations in the framework of scientific projects
  • Invoicing (it will depend on the equipment that will be used and on the involvement of an engineer)
  • service provision

Contacts

Giancarlo Rizza or Pierre-Eugène Coulon