Research engineer

The IMPMC’s SEM-FIB facility provides expertise and technological ressources to characterize porous materials. With FIB 3D nanotomography, it’s possible now to do FIB serial cutting of a large range of materials and rebuild µm3 volumes with high resolution voxels (about 3 to 5 nm).

By using a new dynamic tool assuring real isotropic voxels aquisitions, volumes are more accurate. Its also possible to do correlation with others volumes aquired by others techniques (downccalling approach).

Electron Transmission Microscopy Porous material